It is clear that the most probable diameter is in the range from 70 to 80 nm. The inset of Figure 3b shows a detailed 3D AFM image of the QDs in 1 × 1 μm2, indicating the similar well-formed dot structure. According to the results above, the obtained GaN QDs have a good size distribution. To the best of our knowledge, this is the first report of low-density GaN QDs fabricated via GaN thermal decomposition in MOCVD. Figure SN-38 purchase 3 AFM images of sample
B (a) and diameter distributions of GaN QDs (b). (a) Scan area 10 × 10 μm2; (b) Analyzed from the AFM images of sample B. Inset is the 3D image of obtained GaN QDs. As is shown in Figure 4, since XPS analysis was performed for samples A, B, and C, Ga2p and N1s core level spectra were measured. For both of the XPS spectra, the C1s peak at approximately 285.0 eV was used as binding-energy reference. Baselines were fixed using a Shirley background subtraction model and all peaks Akt inhibitor were fitted using a linear combination of 80% Gaussian and 20% Lorentzian line
shapes. On the one hand, the Ga2p spectra are analyzed in Figure 4a. Both samples A and B have a Ga2p peak which can be fitted as only one GW2580 manufacturer subpeak located at 1,117.1 eV, which is assigned to Ga-N bond [22–24]. So there are no Ga droplets but GaN on the surface of samples A and B, indicating that the Ga desorption rate exceed the GaN decomposition rate. On the contrary, if the Ga desorption rate is less than the GaN decomposition rate, Ga droplets will generate in a chemical manner and Ga-Ga bond will be observed. No Ga2p peaks were observed in sample C, confirming that sample C is just the AlN buffer after H2 decomposition. On the other hand, the N1s spectra are analyzed in Figure 4b. For sample A, the N1s spectra can be decomposed into a total of four fitted subpeaks at 397.0, 398.7, and 400.3 eV, which were assigned to N-Ga bond, N-H2 bond and N-H3 bond [25, 26], respectively.
Only GaN existed on Miconazole the surface of sample A. For sample C, the N1s spectra can be decomposed into one subpeaks at 398.7 eV, which is assigned to N-Al bond [27]. Only AlN existed on the surface of sample C. For sample B, the N1s spectra were decomposed into a total of four fitted subpeaks at 396.2, 397.0, 398.7, and 400.3 eV, which can be assigned to N-Al bond, N-Ga bond, N-H2 bond, and N-H3 bond, respectively. These fitted subpeaks coincide with the fitted subpeaks of samples A and C, providing a chemical evidence for the existence of GaN QDs formed on the AlN buffer. In addition, the N-H2 bond and N-H3 bond were obtained in samples A and B but did not exist in sample C, indicating that the appearance of N-H2 bond and N-H3 bond were caused by the interaction of decomposed GaN and hydrogen at high temperature. Figure 4 XPS spectra of (a) Ga2 p and (b) N1 s for samples A, B, and C.
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